Semiconductor Physics, Quantum Electronics & Optoelectronics. 2002. V. 5, N 1. P. 95-100.
PACS: 71.36.+c, 78.20.-e, 78.68.+m
Reststrahlen spectroscopy of MgAl2O4
1) Institute of Semiconductor Physics, NAS of
Ukraine, 45 prospect Nauky, 03028 Kyiv, Ukraine
Abstract. Using IR reflectance spectroscopy and surface polariton spectroscopy in the reststrahlen region, we investigated Czochralski-grown MgAl2O4 spinel. The computer analysis of variance made for spectra enabled us to get a mathematical model for reflection spectra of spinel. In our calculations we used consistent data for optical parameters (zero- and high-frequency permittivities, transverse optical phonon frequencies and corresponding damping coefficients) of spinel single crystals that have been obtained from comparison between the measured and calculated spectra. These data were used when studying attenuated total reflection spectra and dispersion curves for surface polaritons in MgAl2O4 spinel.
Keywords: reflectance spectroscopy, surface polaritons, spinel, reststrahlen, attenuated total reflection spectra.
Paper received 27.11.01; revised manuscript received 18.01.02; accepted for publication 05.03.02.