References

Semiconductor Physics, Quantum Electronics and Optoelectronics, 6 (1) P. 041-046 (2003).

References

1. V.M. Sinaysky, V.I. Sidenko. Rentgenovskaya reflectometriya (obzor) // Prib. Tekhn. Eksp.(Sov. Phys. - Devices and Techniques of Experiment), 6, p. 131-160 (1974).

2. I.M. Fodchuk, A.M. Raransky, M.L. Kshevetska, S.V. Balovsyak. Trikristalna rentgenivska reflectometriya // Nauk. Visn. CU (Ukr. Phys. - Scientific Bulletin of Chernivtsi University), 32, p. 45-52 (1998).

3. O.S. Lytvyn, I.V. Prokopenko. Vyvchennja morphologii poverhni polycrystalichnyh plivok metodom atomno-sylovoi mikroskopii // Nauk. Visn. CU, 112, p. 5-10 (2001).

4. I.M. Fodchuk, S.V. Balovsyak. Rozrobka kontrolera I programnogo zabezpechennya dlya keruvannya rentgenivskym difraktometrom DRON-3M // Nauk. Visn. CU, 92, p. 32-33 (2000).

5. L.G. Parratt. Surface Studies of Solids by Total Reflection of X-Rays // Ph. Rev, 95(2), p. 359-369 (1954). https://doi.org/10.1103/PhysRev.95.359

6. E. Feder. Fractals. - M.: MIR, 1991.

7. K.S. Clarke. Computation of the fractal dimension of topographic surfaces using the triangular prism surface area method // Computers and Geosciences, 12(5), p. 713-722(1986). https://doi.org/10.1016/0098-3004(86)90047-6

8. A. Segmuller. Observation of X-Ray Interferences on Thin Films of Amorphous Silicon // Thin Solid Films, 18(2), p.287-294 (1973). https://doi.org/10.1016/0040-6090(73)90107-7

9. O.V. Angelsky, P.P. Maksimyak. Koreljatsijno-optychna diagnostyka vypadkovyh ta fraktal'nyh shorstkyh poverhon' // Nauk. Visn. CU, 112, p.37-47 (2001).