Semiconductor Physics, Quantum Electronics & Optoelectronics. 2005. V. 8, N 1. P. 083-086.
Silicon photodiode & preamplifier characteristic properties
under background radiation conditions
Rhythm Optoelectronics Inc., Chernivtsi, Ukraine
Abstract. The investigation results of a silicon photodiode (PD) operation with a
preamplifier under background radiation conditions are presented. The preamplifier
output signal and its frequency characteristic dependence on the input resistance and
capacitance are considered, the influence of the PD radiant-flux characteristic under
background radiation and the preamplifier output signal dependence on the background
current and intrinsic resistance are investigated. It is shown that the change of the PD
parameters under background radiation is similar to the influence of the PD equivalents –
equivalents of capacitance and resistance.
Keywords: photodiode, silicon, preamplifier, radiant-flux characteristic, frequency,
background radiation.
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