Semiconductor Physics, Quantum Electronics & Optoelectronics. 2005. V. 8, N 1. P. 083-086.
https://doi.org/10.15407/spqeo8.01.083


Silicon photodiode & preamplifier characteristic properties under background radiation conditions
V.M. Hodovaniouk, I.V. Doktorovych, V.K. Butenko, V.H. Yuryev, Yu.G. Dobrovolsky

Rhythm Optoelectronics Inc., Chernivtsi, Ukraine

Abstract. The investigation results of a silicon photodiode (PD) operation with a preamplifier under background radiation conditions are presented. The preamplifier output signal and its frequency characteristic dependence on the input resistance and capacitance are considered, the influence of the PD radiant-flux characteristic under background radiation and the preamplifier output signal dependence on the background current and intrinsic resistance are investigated. It is shown that the change of the PD parameters under background radiation is similar to the influence of the PD equivalents – equivalents of capacitance and resistance.

Keywords: photodiode, silicon, preamplifier, radiant-flux characteristic, frequency, background radiation.

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