TY  - JOUR
AU  - V.B. Molodkin
AU  - V.Yu. Storizhko
AU  - V.P. Kladko
AU  - V.V. Lizunov
AU  - A.I. Nizkova
AU  - A.Yo. Gudimenko
AU  - S.I. Olikhovskii
AU  - M.G. Tolmachev
AU  - S.V. Dmitriev
AU  - I.I. Demchyk
AU  - E.I. Bogdanov
AU  - B.I. Hinko
TI  - Integrated dynamical phase-variation diffractometry of single crystals with defects of three and more types
T2  - Semiconductor Physics, Quantum Electronics & Optoelectronics
PY  - 2023
VL  - 26
IS  - 1
SP  - 17
EP  - 24
DO  - 10.15407/spqeo26.01.017
UR  - https://doi.org/10.15407/spqeo26.01.017
AB  - Generalization of the methods for the purposeful influence of the interrelated variations inherent to different experimental conditions on changes in the selectivity of the sensitivity of the azimuthal dependence of the total integrated intensity of dynamical diffraction to various types of defects in single crystals has been carried out. As a result, the improved phase-variation methods with additionally increased sensitivity and informativity of non-destructive structural diagnostics aimed at multi-parametrical single crystal systems have been developed.
KW  - phase variation diagnostics
KW  - azimuthal dependence
KW  - defects
ER  -