Semiconductor Physics, Quantum Electronics & Optoelectronics, 29 (1), P. 057–065 (2026).
DOI: https://doi.org/10.15407/spqeo29.01.057

Peculiarities of dielectric losses in Fe_xO_y nanocomposite films

A.A. Evtukh^1,2*, A.I. Pylypov², Y.U. Muryi¹, O.V. Pylypova², S.V. Antonin¹, O.L. Bratus<sup>1

1</sup>V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 41 Nauky Ave., 03028 Kyiv, Ukraine
²Educational Scientific Institute of High Technologies, Taras Shevchenko National University of Kyiv, 4-g Hlushkova Avenue, Kyiv, Ukraine
*Corresponding author e-mail: anatoliy.evtukh@gmail.com

Abstract. Dielectric losses are one of the key parameters of dielectric materials. This work presents results on dielectric losses in Fe_xO_y nanocomposite films in the frequency range 5 kHz–5 MHz. It was shown that dielectric losses decrease with frequency and increase with applied voltage. The dominant contribution arises from polarization mechanisms, while conductive losses are lower but increase with voltage. The dielectric loss tangent and imaginary permittivity are higher for as-deposited films compared to annealed ones due to structural ordering. Overall, dielectric losses are governed by relaxation polarization typical for disordered nanocomposites.

Keywords: nanocomposite films, dielectric losses, polarization, frequency, voltage, ion-plasma deposition, annealing.

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