@article{Evtukh2026Peculiarities,
  author = {Evtukh, A.A. and Pylypov, A.I. and Muryi, Y.U. and Pylypova, O.V. and Antonin, S.V. and Bratus, O.L.},
  title = {Peculiarities of dielectric losses in FexOy nanocomposite films},
  journal = {Semiconductor Physics, Quantum Electronics \& Optoelectronics},
  year = {2026},
  volume = {29},
  number = {1},
  pages = {057--065},
  doi = {10.15407/spqeo29.01.057},
  url = {https://doi.org/10.15407/spqeo29.01.057},
  abstract = {Dielectric losses are one of the key parameters of dielectric materials. This work presents results on dielectric losses in FexOy nanocomposite films in the frequency range 5 kHz–5 MHz. It was shown that dielectric losses decrease with frequency and increase with applied voltage. The dominant contribution arises from polarization mechanisms, while conductive losses are lower but increase with voltage. The dielectric loss tangent and imaginary permittivity are higher for as-deposited films compared to annealed ones due to structural ordering. Overall, dielectric losses are governed by relaxation polarization typical for disordered nanocomposites.},
  keywords = {nanocomposite films, dielectric losses, polarization, frequency, voltage, ion-plasma deposition, annealing.}
}