Semiconductor Physics, Quantum Electronics and Optoelectronics, 2 (1) P. 056-061 (1999).


References

1. A. Borghesi, B. Pivac, A. Sassella, A. Stella, Oxygen precipitates in silicon // J.Appl.Phys.,77, pp.4169-4244 (1995).
https://doi.org/10.1063/1.359479
2. V. M. Babich, N. I. Bletskan, E. F. Venger, Kislorod v monokristallakh kremniya (in Russian) Kiev., Interpress LTD Publishing company (1997).p. 239.
3. X.-T. Meng. Radiation-enhanced oxygen precipitates in neutron-transmutation-doped floating zone silicon // Phys.Stat.Sol.(a).,129(2), pp.K131-K136 (1992).
https://doi.org/10.1002/pssa.2211290240
4. T. Hallberg, J. L. Lindstrom, Enhanced oxygen precipitates in electron irradiated Si // J.Appl.Phys., 72(11). pp.5130-5138 (1992).
https://doi.org/10.1063/1.352043
5. L. Datsenko, A. Misiuk, V. Machulin, V. Khrupa, Vliyaniye temperatury, hydrostaticheskogo szhatia i drugich fisicheskikh factorov na evolyutsiyu structur pri pretsipitatsii kisloroda v kremnii, Poverchnost // Rentgenovskie, neutronnie i synchrotronniye issledovaniya, 10, pp.122-137 (1998).
6. D.Zymierska, D. Klinger, J. Auleytner, T. Czosnyka, L. Datsenko. Studies of the near- surface layers of silicon crystals implanted with fast ions // Nucl. Instr. and Meth., B146. pp.350-355 (1998).
https://doi.org/10.1016/S0168-583X(98)00472-8
7. L. Datsenko, A. Misiuk, J. Hartwig, A. Briginetz, V. I. Khrupa,Influence of preannealing on perfection of CzSi crystals subjected to high pressure treatment // Acta Phys.Polonica, 86(4). pp.585-590 (1994).
https://doi.org/10.12693/APhysPolA.86.585
8. J. J. De Marco, R. J. Weiss, The integrated intensities of perfect crystals, 19(1). pp.68-72 (1965).
https://doi.org/10.1107/S0365110X65002785
9. L. I. Datsenko, V. B. Molodkin, M. E. Osinovski, Dynamicheskoye rasseyanie rentgenovskich luchey realnymi kristallami(in Russian), Naukova dumka publishing company, Kyiv, (1988).