Semiconductor Physics, Quantum Electronics and Optoelectronics, 4 (2) P. 082-084 (2001).
References
1. Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady State Surface Photovoltage. In: Annual Book of ASTM Standards, Section 10, Electrical Insulation and Electronics, Vol.10.05 Electronics (II), Designation: F 391-96 (1997).