Semiconductor
Physics, Quantum Electronics & Optoelectronics. 2017. V. 20, N
2. P. 195-198 (2017). References 1. Aleinikov A.B., Berezovets V.A., Borblik V.L., Shwarts M.M., and Shwarts Yu.M. Effect of magnetic field on hysteretic characteristics of silicon diodes under conditions of low-temperature impurity breakdown. Semiconductor Physics, Quantum Electronics & Optoelectronics. 2012. 15, No. 3. P. 288–293. https://doi.org/10.15407/spqeo15.03.288 2. Shwarts Yu.M., Borblik V.L., Kulish N.R., Sokolov V.N., Shwarts M.M., and Venger E.F. Silicon diode temperature sensor without a kink of the response curve in cryogenic temperature region. Sensors and Actuators. 1999. 76, No. 1-3. P. 107–111. https://doi.org/10.1016/S0924-4247(98)00361-6 3. Borblik V.L., Shwarts Yu.M., and Shwarts M.M. Revealing the hopping mechanism of conduction in heavily doped silicon diodes. Semiconductor Physics, Quantum Electronics & Optoelectronics. 2005. 8, No.2. P. 41–44. 4. Borblik V.L., Shwarts Yu.M., and Shwarts M.M. Manifestation of disorder effects in excess tunnel current of heavily doped silicon diodes. Bull. Russian Acad. Sci.: Physics. 2007. 71, No. 8. P. 1073–1075. https://doi.org/10.3103/S1062873807080059 5. Borblik V.L., Shwarts Yu.M., and Shwarts M.M. Characteristics of diode temperature sensors which exhibit Mott conduction in low-temperature region. Semiconductor Physics, Quantum Electronics & Optoelectronics. 2007. 10, No. 3. P. 44–47. 6. Sze S.M. Physics of Semiconductor Devices. 2nd ed., John Wiley & Sons, New York, 1981. 7. Del Alamo J.A. and Swanson R.M. Forward-bias tunneling: a limitation to bipolar device scaling. IEEE Electron. Device Lett. 1986. EDL-7(11). P. 629–631. https://doi.org/10.1109/EDL.1986.26499 8. Shklovskii B.I. Hopping conduction of heavily doped semiconductors. Sov. Phys.-Semicond. 1973. 7, No. 1. P. 77–83 (in Russian). 9. Borblik V.L., Rudnev I.A., Shwarts Yu.M., and Shwarts M.M. Negative magnetoresistance of heavily doped silicon p-n junction. Semiconductor Physics, Quantum Electronics & Optoelectronics. 2010. 14, No. 1. P. 88–90. https://doi.org/10.15407/spqeo14.01.088 10. Shkovskii B.I. and Efros A.L. Electronic Properties of Doped Semiconductors. Berlin, Springer, 1984. https://doi.org/10.1007/978-3-662-02403-4 11. Ionov A.N., Rentzsch R., and Shlimak I. Role of electron "lakes" in the effect of negative magnetoresistance in the region of Mott hopping conductivity. JETP Lett. 1996. 63, No. 3. P. 199–203. https://doi.org/10.1134/1.567006 |