Semiconductor Physics, Quantum Electronics & Optoelectronics, 27 (2), P. 169-175 (2024).
DOI: https://doi.org/10.15407/spqeo27.02.169

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Microhardness of single-crystal samples of Ag7+x(P1–xGex)S6 solid solutions

I.O. Shender1,*, A.I. Pogodin1, M.J. Filep1,2, T.O. Malakhovska1, O.P. Kokhan1,

1 Uzhhorod National University, 46, Pidhirna str., 88000 Uzhhorod, Ukraine
2 Ferenc Rákóczi II Transcarpathian Hungarian Institute, Kossuth Sq. 6, 90200 Beregovo, Ukraine
3 Comenius University, Mlynska dolina, Bratislava 84248, Slovakia
*Corresponding author e-mail: shender95@gmail.com



Abstract. This work presents the results of microhardness investigations of single-crystal samples of Ag7+x(P1–xGex)S6 (x = 0, 0.1, 0.25, 0.33, 0.5, 0.75, 1) solid solutions. The dependences of microhardness H on load P and sample composition were investigated. The microhardness was found to decrease with applied load, which indicates presence of “normal” indentation size effect in Ag7+x(P1–xGex)S6 solid solutions. The obtained results were approximated in the framework of the geometrically necessary dislocations (Nix–Gao) model, and the model parameters were found. The effect of heterovalent Р5+ → Ge4+ substitution on the mechanical properties of Ag7+x(P1–xGex)S6 crystals was determined.

Keywords:argyrodite, single crystal, microhardness..

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