TY  - JOUR
TI  - Microhardness of single-crystal samples of Ag7+x(P1–xGex)S6 solid
      solutions
T2  - Semiconductor Physics, Quantum Electronics & Optoelectronics
AU  - Shender, I.O.
AU  - Pogodin, A.I.
AU  - Filep, M.J.
AU  - Malakhovska, T.O.
AU  - Kokhan, O.P.
VL  - 27
IS  - 2
SP  - 169
EP  - 175
PY  - 2024
DA  - 2024
DO  - 10.15407/spqeo27.02.169
UR  - https://doi.org/10.15407/spqeo27.02.169
AB  - This work presents the results of microhardness investigations of
      single-crystal samples of Ag7+x(P1–xGex)S6 (x = 0, 0.1, 0.25, 0.33, 0.5,
      0.75, 1) solid solutions. The dependences of microhardness H on load P
      and sample composition were investigated. The microhardness was found to
      decrease with applied load, which indicates presence of “normal”
      indentation size effect in Ag7+x(P1–xGex)S6 solid solutions. The
      obtained results were approximated in the framework of the geometrically
      necessary dislocations (Nix–Gao) model, and the model parameters were
      found. The effect of heterovalent Р5+ → Ge4+ substitution on the
      mechanical properties of Ag7+x(P1–xGex)S6 crystals was determined.
KW  - argyrodite
KW  - single crystal
KW  - microhardness
ER  -