TY  - JOUR
TI  - Fabrication, structural, and optical properties of ZnO films obtained
      by pyrolysis of a chelate compound
T2  - Semiconductor Physics, Quantum Electronics & Optoelectronics
AU  - V.S. Khomchenko
AU  - L.V. Zavyalova
AU  - V.V. Strelchuk
AU  - O.F. Kolomys
AU  - A.S. Nikolenko
AU  - O.Yo. Gudymenko
AU  - A.A. Korchovyi
AU  - V.A. Danko
AU  - B.A. Snopok
VL  - 29
IS  - 2
SP  - 172
EP  - 179
PY  - 2026
DA  - 2026
AB  - Thin ZnO films were chemically obtained from two organic compounds.
      Chelate (or intracomplex) compounds zinc diethyldithiocaramate and
      zinc acetylacetonate were used as precursors. The effects of precursor
      type, growth rate, and post-growth annealing of the films were
      investigated. The microstructure and optical properties of the films
      were studied and compared using X-ray diffraction (XRD), atomic force
      microscopy, Raman scattering, and photoluminescence. The XRD results
      indicated that all the ZnO films had a polycrystalline hexagonal
      structure and a preferred orientation with the c-axis perpendicular to
      the substrate. The morphological and optical properties differ
      markedly for various ZnO films. The reasons of transformation and the
      nature of optical transitions were discussed. The most intensive UV
      emission was obtained for the ZnO films grown from zinc
      acetylacetonate. The ultraviolet/visible emission intensity ratio was
      15, comparable to that of epitaxial ZnO films. A simple way for
      fabricating high-quality ZnO films was presented.
KW  - ZnO
KW  - thin films
KW  - metal-organic chemical vapor deposition technique
KW  - photoluminescence
KW  - atomic force microscopy
KW  - X-ray diffraction
KW  - Raman spectroscopy
DO  - 10.15407/spqeo29.02.172
UR  - http://journal-spqeo.org.ua/n2_2026/v29n2-p172-179.pdf
ER  -