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Semiconductor Physics, Quantum Electronics & Optoelectronics. 2010. V. 13, N 3. P. 248-258.
Polarization-singular structure in laser images
of phase-inhomogeneous layers to diagnose
and classify their optical properties
Yuri Fedkovych Chernivtsi National University,
2 Kotsybynsky str., 58012 Chernivtsi, Ukraine
Abstract. Adduced in this work are the results of investigation aimed at analysis of
coordinate distributions for azimuths and ellipticity of polarization (polarization maps) in
laser images of three types of phase-inhomogeneous layers (PhIL), namely: rough,
ground and bulk scattering layers. To characterize polarization maps for all the types of
PhIL, the authors have offered to use three groups of parameters: statistical moments of
the first to fourth orders, autocorrelation functions, logarithmic dependences for power
spectra related to distributions of azimuths and ellipticity of polarization inherent to PhIL
laser images. Ascertained are the criteria for diagnostics and classification of PhIL
optical properties.
Keywords: polarization, rough surface, phase-inhomogeneous layer, statistical moment,
autocorrelation.
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