Semiconductor Physics, Quantum Electronics & Optoelectronics. 2010. V. 13, N 3. P. 259-261.
https://doi.org/10.15407/spqeo13.03.259


Relaxation process features of photoconductivity in p-i-n structures
R.A. Mumimov1, Sh.K. Kanyazov2, A.K. Saymbetov1

1Physical-Technical Institute, 100084 Tashkent, Uzbekistan E-mail: detector@uzsci.net
2Karakalpak State University, 742012 Nukus, Uzbekistan

Abstract. We studied the relaxation processes of photoconductivity in Si(Li) p-i-n structures. It has been shown that a clearly pronounced “well” is observed in time dependences of the photovoltage pulse after photoexcitation of these structures. Our experimental data are indicative of abnormal relaxation of photoconductivity in silicon p- i-n diodes.

Keywords: photoconductivity, relaxation, well.

Full Text (PDF)

Back to N3 Volume 13