@article{Stronski2021312,
  title = {The boson peak and the first sharp diffraction peak in (As 2 S 3 ) x (GeS 2 ) 1-x glasses},
  author = {A.V. Stronski and T.S. Kavetskyy and L.O. Revutska and I. Kaban and P. Jóvári and K.V. Shportko and V.P. Sergienko and M.V. Popovych},
  journal = {Semiconductor Physics, Quantum Electronics & Optoelectronics},
  year = {2021},
  volume = {24},
  number = {3},
  pages = {312-318},
  doi = {10.15407/spqeo24.03.312},
  keywords = {chalcogenide glasses, Raman spectroscopy, X-ray diffraction, boson peak, first sharp diffraction peak, molecular structural units},
  abstract = {The parameters of the boson peak (BP) and the first sharp diffraction peak (FSDP) in (As2S3)x(GeS2)1x glasses measured using high-resolution Raman spectroscopy and high-energy synchrotron X-ray diffraction measurements are examined as a function of x. It has been found that there is no correlation between the positions of BP and FSDP. The BP position shows a nonlinear composition behavior with a maximum at about x = 0.4, whereas the FSDP position changes virtually linearly with x. The intensities of both BP and FSDP show nonlinear composition dependences with the slope changes at x = 0.4, although there is no direct proportionality. Analysis of the partial structure factors for the glasses with x = 0.2, 0.4 and 0.6 obtained in another study has shown that the cation-cation atomic pairs of Ge–Ge, Ge–As and As–As make the largest contribution to FSDP, where the Ge–Ge and Ge–As pairs are dominant.}
}