TY  - JOUR
AU  - A.V. Stronski
AU  - T.S. Kavetskyy
AU  - L.O. Revutska
AU  - I. Kaban
AU  - P. Jóvári
AU  - K.V. Shportko
AU  - V.P. Sergienko
AU  - M.V. Popovych
TI  - The boson peak and the first sharp diffraction peak in (As 2 S 3 ) x (GeS 2 ) 1-x glasses
T2  - Semiconductor Physics, Quantum Electronics & Optoelectronics
VL  - 24
IS  - 3
SP  - 312
EP  - 318
PY  - 2021
DO  - 10.15407/spqeo24.03.312
UR  - https://doi.org/10.15407/spqeo24.03.312
AB  - The parameters of the boson peak (BP) and the first sharp diffraction peak (FSDP) in (As2S3)x(GeS2)1x glasses measured using high-resolution Raman spectroscopy and high-energy synchrotron X-ray diffraction measurements are examined as a function of x. It has been found that there is no correlation between the positions of BP and FSDP. The BP position shows a nonlinear composition behavior with a maximum at about x = 0.4, whereas the FSDP position changes virtually linearly with x. The intensities of both BP and FSDP show nonlinear composition dependences with the slope changes at x = 0.4, although there is no direct proportionality. Analysis of the partial structure factors for the glasses with x = 0.2, 0.4 and 0.6 obtained in another study has shown that the cation-cation atomic pairs of Ge–Ge, Ge–As and As–As make the largest contribution to FSDP, where the Ge–Ge and Ge–As pairs are dominant.
KW  - chalcogenide glasses
KW  - Raman spectroscopy
KW  - X-ray diffraction
KW  - boson peak
KW  - first sharp diffraction peak
KW  - molecular structural units
ER  -