Semiconductor Physics, Quantum Electronics & Optoelectronics, 29 (3), P. 344-353 (2026).
DOI: https://doi.org/10.15407/spqeo29.03.344

Improving accuracy of differential parameter extraction from noisy measurement data

D.A. Kuznietsova

V. Lashkaryov Institute of Semiconductor Physics of the National Academy of Sciences of Ukraine,
41 Nauki Avenue, 03028 Kyiv, Ukraine
E-mail: d.kuznietsova@isp.kiev.ua

Abstract. The paper addresses the problem of enhancing the accuracy of differential analysis of integral characteristics of semiconductor structures under conditions of experimental noise. It is shown that standard measurement methods with a linear voltage step lead to significant errors in calculating the dimensionless sensitivity, manifesting themselves as non-physical oscillations that complicate the identification of charge transport mechanisms. A comparative analysis of three data processing methods is conducted: the optimal step method, polynomial approximation (Savitzky–Golay filter), and adaptive filtering based on the Kalman algorithm. It is established that application of the optimal step method based on logarithmic current sampling avoids differentiation artifacts without introducing phase delays characteristic of smoothing methods. The proposed approaches are tested on experimental current-voltage characteristics of OLED structures, confirming their suitability for precise diagnostics of electrophysical parameters of semiconductor devices.

Keywords: current-voltage characteristic, dimensionless sensitivity, differential analysis, optimal step method, Savitzky–Golay filter, Kalman filter, semiconductor structure.