References

Semiconductor Physics, Quantum Electronics and Optoelectronics, 2 (3) P. 013-020 (1999).

References

1. S.I. Gorban, S.V. Orlov, U.A. Pervak, I.V. Fekeshgasi. Multi ply kovering with broad zone reflection and transmition. // Ukrainskii fizicheskii zhurnal, 31, N 10, p.1494-96, (1986) (in Russian).

2. A.A. Aliseev, I.V. Ravadina. Prinsip of criation tunable interferation filter // Izvestiya vuzov. Ser. fizich., N 3, p.3, (1997) (in Russian)

3. L.I. Suslikov, V.P. Slivka, I.P. Lisitsa. Hard optical filter on the hirotropic crystals. Eiav, «Interpress LTD», 1998, p.292. (in Russian).

4. M. Wittmann, A. Panzkofer. Spectroscopic characterization of semiconductor doped colour filter glasses // Opt. Quant Electr., 27, N8, p.705, (1995) https://doi.org/10.1007/BF00576722

5. I.P. Lisitsa, S.V. Irlov, U.A. Parvae, I.V. Fekeshgasi. Multi ply kovering with suppression of two ajasent zone of high reflection // Zhurnal prikladnoi spektroskopii, 47, N 2, p.283, (1987) (in Russian). https://doi.org/10.1007/BF00679262

6. A.D. Petrenko, G.I. Orush, U.A. Parvae, I.V. Fekeshgasi. Reflection of ligh by kovering with fractal strukcher. // Optika i spektroskopiya, 83, N 3, p.416, (1997) (in Russian).

7. U.A. Parvae, I.V. Fekeshgasi. Spectral characteristics of prism interferention polarizer // Optika and spektroskopiya, 77, N 5, pp.843- 846, (1994) (in Russian).

8. U.A. Parvae, I.V. Fekeshgasi. Optimization of constructions of prism interferention polarizers and partishioners // Optika i spektroskopiya, 86, N 1, p.153, (1999) (in Russian).

9. W. Kruhler, Amorphous thin-film solar cells // Appl. Phys. A, 53, N 1, p.54, (1991) https://doi.org/10.1007/BF00323435

10. F.I. Sebastian, N. Sivaramakishnan. The prospects of CdTe thin films as solar contour coatings // Thin Sol. Films, 202 , N 1, p.1, (1991) https://doi.org/10.1016/0040-6090(91)90535-6

11. R.E. Iuhamedov. Determination of optimalii index of refraction of phototropic kovering. //Opt-mah. fact., pub. 2, p.57, (1991) (in Russian).

12. A.N. Eitlikov, G. . Oarashchanei. Investigation of film optical constans, which use for synthesis of wide-band phototropic kovering. // Optika i spektroskopiya, 82, N 4, pp.653-659, (1997) (in Russian).

13. F. Goos, Zs. Phys., 100, N 1-2, 95, (1936); 105 , N 1, p.606, (1937) https://doi.org/10.1007/BF01337747

14. I. Krautkramer, Proc. Phys. Soc., 32 , p.537, (1938) https://doi.org/10.1002/andp.19384240606

15. B. Pogany, Ann. d. Phys., 49, p.537, (1916)

16. I.P. Lisitsa, N.G. Tsvelyh. Optics of thin film (II Te) // Optika and spektroskopiya, 4, N 3, pp.373-377, (1958) (in Russian).

17. I.P. Lisitsa, V.I. Iyevsky, N.G. Tsvelyh. Optics of thin film (III Se) // Optika i spektroskopiya, 5, N 2, pp.179-183, (1958) (in Russian).

18. I.P. Lisitsa, N.G. Tsvelyh. Optics of thin film (IV Ge) // Optika i spektroskopiya, 5, N 5, p.622, (1958) (in Russian).

19. H. Murman. Zeitschr. f. Phys. 80, s. 167, (1933)

20. Z. G. Sohulz and F. R. Tangherlini, JOSA, 44; N5, c.362, (1954) https://doi.org/10.1364/JOSA.44.000362

21. G.O. Iitulevich, A.A. Shubin. Impact form of Fermy surfase of gold on the optical constant and Holl effect // Zhurnal eksperimental'noi i teoreticheskoi fiziki, 47, pub. 3(9), pp.840-847, (1964) (in Russian).

22. D.L. Windt, W.C. Cash, J.M. Scott, P. Arendt, B. Newnam, R.F. Fisher, A.B. Swartzlander, P.Z. Takacs, J.M. Pinneo. Optical constants for thin films of Ti, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Ir, Os, Pt, and Au from 24 Å to 1216 Å // Apl. Opt. 27, pp. 246-278, (1988) https://doi.org/10.1364/AO.27.000246

23. A.I. Filatova, A.S. Shulakov, V.A. Lukyanov. Depth saping of reflection beam of smooth x-ray radiation in mirror reflection term. // Solid State Phisycs, 7, pp.1360-1363, (1998) (in Russian).

24. T.A. Kudykina. Bondary conditions in case electromagnetic wave absorption // Phis. Stat. Sol (b) 160, pp. 365-373, 1990 https://doi.org/10.1002/pssb.2221600136

Optical protertis of semiconductors (Ge, Se, GaAs, InSb) 165, pp. 591-598, (1991)

25. O.A. Eudyeina, I.P. Lisitsa. Dimention dependens of thin film Ge, Si, Se, Te // Optoelectronic and semiconductor technics, pp. 106-114, (1997) (in Russian).