Semiconductor Physics, Quantum Electronics and Optoelectronics, 2 (3) P. 074-080 (1999).
References
1. Xu D-X, Shen G-D, Willander M, Ni W-X and Hansson G V 1988 Appl. Phys. Lett. 52 223941https://doi.org/10.1063/1.99543 2. Willander M, Shen G-D, Xu D-X and Ni W-X 1988 J.Appl. Phys. 63 50369https://doi.org/10.1063/1.340451 3. Chen N X, Schork R and Ryssel H 1995 Nucl. Instr. and Methods in Phys. Research B 96 2869https://doi.org/10.1016/0168-583X(94)00501-X 4. Lysenko V S, Sytenko T N, Zimenko V I, Tyagulski I P and Snitko O V 1980 Phys. Status Solidi (a) 59 1159https://doi.org/10.1002/pssa.2210590116 5. Lysenko V S, Sytenko T N, Snitko O V, Zimenko V I, Nazarov A N, Osiyuk I N, Rudenko T E and Tyagulski I P 1986 Solid State Comm. 57 1714https://doi.org/10.1016/0038-1098(86)90132-8 6. Buehler M G 1972 Solid State Electr. 15 6979https://doi.org/10.1016/0038-1101(72)90068-8 7. Wu C-Y 1982 Journ. Appl. Phys. 53 594750 8. Tseng H-H and Wu C-Y 1987 Solid-State Electronics 30 38390https://doi.org/10.1016/0038-1101(87)90166-3 9. Tseng H-H and Wu C-Y 1987 Journ. Appl. Phys. 61 299-304https://doi.org/10.1063/1.338820 10. Patel C J and Butcher J B 1997 Mat. Res. Soc. Symp. Proc. 438 2238https://doi.org/10.1557/PROC-438-223 11. Menendez J, Gopalan P, Spencer G S, Cave N and Strane J W 1995 Appl. Phys. Lett. 66 11602https://doi.org/10.1063/1.113843 12. Bremond G, Soufi A, Benyattou T and Dutartre D 1992 Thin Solid Films 222 608https://doi.org/10.1016/0040-6090(92)90039-E 13. Elliman R G and Wong W C 1993 Nucl. Instr. and Methods in Phys. Research B 80/81 76872 14. Walker J W and Sah C T 1972 Phys. Status Solidi (a) 11 51322https://doi.org/10.1002/pssa.2210110214 15. Lalita J, Svensson B G and Jagadish C 1995 Nucl. Instr. and Methods in Phys. Research B 96 210-4https://doi.org/10.1016/0168-583X(94)00484-6 16. Takahashi J and Makino T 1988 J. Appl. Phys. 63 8791https://doi.org/10.1063/1.340467
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