Semiconductor Physics, Quantum Electronics and Optoelectronics, 3 (4) P. 438-444 (2000).

References

1. S.K. Sinha, E. B. Sirota, S. Garoff, H. B. Stanley, X-ray and neutron scattering from rough surfaces // Phys. Rev. B. 38, pp. 2297-2311(1988).
https://doi.org/10.1103/PhysRevB.38.2297
2. D.K. Bowen, B. K. Tanner, Characterization of engineering surfaces by grazing-incidence Õ-ray reflectivity // Nanotechnology. 4, pp 175-182(1993).
https://doi.org/10.1088/0957-4484/4/4/001
3. W. Weber, B. Lengeler, Diffuse scattering of hard Õ-rays from rough surfaces // Phys. Rev. B.46, pp. 7953-7956 (1993).
https://doi.org/10.1103/PhysRevB.46.7953
4. O.A. Sakata, Y. Nikulin, H. Hashizume, X-ray evaluation of microroughness of mechanochemically polished silicon surfaces // Jpn. J. Appl. Phys. 32, pp. L616-L619(1993).
https://doi.org/10.1143/JJAP.32.L616
5. D.K. Bowen, M. Wormington, Grazing incidence X-ray characterization of materials // Advances in X-Ray Analysis. 36,pp. 171-184 (1993).
https://doi.org/10.1154/S0376030800018772
6. D. Zymierska, J. Auleytner, Application of X-rays to the Study of the Surface Roughness // Cryst. Res. Technol. 32, pp. 135-141 (1997).
https://doi.org/10.1002/crat.2170320113
7. J.A. De Rose, R. M. Leblanc, Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films // Surf.Sci. rep.22, pp. 73-126 (1995).
https://doi.org/10.1016/0167-5729(95)00003-8
8. P. Beckmann, A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces, Pergamon Press, Oxford 492 p. (1963).
9. B.B. Mandelbrot, The Fractal Geometry of Nature, Freeman, New York 1982.
10. G. Rasigni, M. Rasigni, J. Palmari, C. Dussert, F. Varnier, A. Llebaria, Statistical parameters for random and pseudo-random rough surfaces // J. Opt. Soc. Am. A 5,N1, pp. 99-103 (1988).
https://doi.org/10.1364/JOSAA.5.000099
11. D. Zymierska, Determination of Surface Roughness by Grazing Incidence X-ray Reflectivity, // Acta Phys Polon. A.89,pp. 347-352(1996).
https://doi.org/10.12693/APhysPolA.89.347
12. L.G. Parratt, Surface Studies of Solids by Total Reflection of X-Rays // Phys. Rev.95, pp. 359-369(1954).
https://doi.org/10.1103/PhysRev.95.359
13. S. K. Sinha, Surface Roughness by X-ray and Neutron Scattering Methods // Acta Phys. Polon. A. 89, pp. 219-234(1996).
https://doi.org/10.12693/APhysPolA.89.219
14. N.L. Dmitruk, T. R.Barlas, E.V. Basiuk, Preparation, morpholy and physical properties of microrelief InP surfaces // Solar Energy Mater. Solar Cells. 31, pp. 371-382(1993).
https://doi.org/10.1016/0927-0248(93)90131-L
15. N.L. Dmitruk, V.G. Litovchenko, S.V. Mamikin, Photo-emission of microrelief semiconductor surfaces with semitrans-parent Au films // J. Vac. Sci. Technol. B. 13,N2, pp. 445-447 (1995).
https://doi.org/10.1116/1.587967