Semiconductor Physics, Quantum Electronics and Optoelectronics, 9 (4) P. 045-048 (2006).
References
1. O.F. Nemets, N.E. Grigorian, P.G. Litovchenko, V.Ja. Opilat, V.P. Tartachnyk, I.I. Tychyna, Radiation defects in GaP, irradiated by α-particles and electrons // Doklady AN USSR, Ser.A, 8, p. 54-56 (1988) (in Russian). | | 2. D.N. Shaw, Influence of substrate temperature on GaAs epitaxial deposition rates // Electrochem. Soc.115, p. 405 (1968). https://doi.org/10.1149/1.2411231 | | 3. R.A. Burmeister, G.P. Pighini, P.E. Greene, Large area epitaxial growth of GaAs1-xPx for display applications // Trans. Metal. Soc. AYME 245, p. 587-593 (1969). | | 4. G.A. Rozgonoi, R.H. Saul, Effect of substrate preparation on the perfection of GaP liquid phase epitaxy layers // J. Appl. Phys. 43(6), p. 1186-1190 (1972). https://doi.org/10.1063/1.1661234 | | 5. T. Kawakubo, M. Okada, Optical and electron paramagnetic resonance studies on neutron-irradiated GaP crystals // Phys. status solidi (b) 106, p. 81-85 (1988). | | 6. G.R. Summers, E.A. Burke, P. Shapiro, S.R. Messenger, R.J. Walters, Damage correlations in semiconductors exposed to gamma, electron and proton radiations // IEEE Trans. Nucl. Sci.40, p. 1372-1377 (1992). https://doi.org/10.1109/23.273529 | | 7. A. Polity, Th. Abgarjan, R. Krause-Rehberg, Defects in electron irradiated GaP studied by positron lifetime spectroscopy // J. Appl. Phys. A 60, p. 541-544 (1995). https://doi.org/10.1007/BF01538526 | | 8. N. A. Vitovskij, The method of the determination of the charge of quasi-point clusters of impurities and defects in semiconductors and cluster distribution functions by charge // Fizika Tekhn. Poluprov. 16(5), p. 882-885 (1982) (in Russian). | | 9. P.G. Litovchenko, V.G. Makarenko, V.Ja. Opilat, V.P. Tartachnyk, I.I. Tychyna, Relaxation of the conductivity of irradiated GaP // Ukrain. Fizich. Zhurn. 33(3), p.367-390 (1988) (in Russian). | | 10. S.I. Radautcan, V.G. Makarenko, V.Ja. Opilat, V.P. Tartachnyk, I.I. Tychyna, Relaxation of the conductivity and radiation defect annealing in GaP irradiated by gamma-particles // Doklady AN USSR. Ser. A 5, p. 50-53 (1988) (in Russian). | | 11. P. Litovchenko, D. Biselbo, A. Litovchenko, S. Kanevskyj, V. Opilat, M. Pinkovska, V. Tartachnik, R. Rando, P. Giubilabo, V. Khomenkov, Some features of current-voltage characteristics of irradiated GaP light diodes // Nucl. Instrum. Meth. Phys. Res.A552, p. 93-97 (2005). https://doi.org/10.1016/j.nima.2005.06.013 | | 12. L. Berman, Capacitive methods of semiconductor study. Nauka, Leningrad, 1972 (in Russian). | | 13. S.M. Sze, G. Gibbons, Avalanche breakdown voltages of abrupt and linearly graded p-n-junction in Ge, Si, GaAs and GaP // Appl. Phys. Lett. 8, p. III (1966). https://doi.org/10.1063/1.1754511 | | 14. K.S. Rzhevkin, Physical principles of semiconductor device operation. Moscow State University, Moscow, 1986, p. 255 (in Russian). | |
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