Semiconductor Physics, Quantum Electronics and Optoelectronics, 13 (4) P. 374-378 (2010).
DOI: https://doi.org/10.15407/spqeo13.04.374


References

1. L.G. Rubin, Cryogenic thermometry: a review of progress since 1982 // Cryogenics, 37(7), p. 341- 356 (1997).
https://doi.org/10.1016/S0011-2275(97)00009-X
2. P.R.N. Childs, J.R. Greenwood, C.A. Long, Review on temperature measurement // Rev. Sci. Instrum., 71(8), p. 2959 (2000).
https://doi.org/10.1063/1.1305516
3. S.S. Courts, P.R. Swinehart, C.J. Yeager, A new cryogenic diode thermometer // Adv. in Cryogenic Eng. B, 47, p. 1620-1627 (2002).
https://doi.org/10.1063/1.1472198
4. Temperature Measurement and Control Catalog. Cryogenic Sensors, Instruments, and Accessories. Published by Lake Shore Cryotronics, Inc., Westerville, OH (USA), 2004.
5. O.M. Ivashchenko, Yu.M. Shwarts, Approximation of thermometric characteristics inherent to silicon temperature diode sensors // Optoelektronika i poluprovodnikovaya tekhnika, 38, p. 61-70 (2003), in Russian.
6. P. Ciarlini, D. Ichim, Free-knot cubic spline modelling in cryogenic thermometer calibration // Measurement, 39(9), p. 815-820 (2006).
https://doi.org/10.1016/j.measurement.2006.04.006
7. N.I. Terikhova, Cubic smoothing splines // Matematicheskoye modelirovaniye, 2(8), p. 112- 118 (1990) in Russian.
8. Yu.M. Shwarts, O.M. Ivashchenko, M.M. Shwarts et al., Metrological support for diode thermometry // Pribory, 86(8), p. 5-11 (2007) in Russian.