Semiconductor Physics, Quantum Electronics & Optoelectronics. 2002. V. 5, N 1. P. 95-100.

PACS: 71.36.+c, 78.20.-e, 78.68.+m

Reststrahlen spectroscopy of MgAl₂O₄ spinel
N.N. Boguslavska¹⁾, E.F. Venger¹⁾, N.M. Vernidub²⁾, Yu.A. Pasechnik²⁾, K.V. Shportko²⁾

1) Institute of Semiconductor Physics, NAS of Ukraine, 45 prospect Nauky, 03028 Kyiv, Ukraine
Phone: +380 (44) 265 6205; fax: +380 (44) 265 5430
2) M.Dragomanov National Pedagogic University, 9 Pirogova St., 01030 Kyiv, Ukraine
Phone: +380 (44) 224 6557; fax: +380 (44) 224 2251

Abstract. Using IR reflectance spectroscopy and surface polariton spectroscopy in the reststrahlen region, we investigated Czochralski-grown MgAl₂O₄ spinel. The computer analysis of variance made for spectra enabled us to get a mathematical model for reflection spectra of spinel. In our calculations we used consistent data for optical parameters (zero- and high-frequency permittivities, transverse optical phonon frequencies and corresponding damping coefficients) of spinel single crystals that have been obtained from comparison between the measured and calculated spectra. These data were used when studying attenuated total reflection spectra and dispersion curves for surface polaritons in MgAl₂O₄ spinel.

Keywords: reflectance spectroscopy, surface polaritons, spinel, reststrahlen, attenuated total reflection spectra.

Paper received 27.11.01; revised manuscript received 18.01.02; accepted for publication 05.03.02.

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