Semiconductor Physics, Quantum Electronics & Optoelectronics, 5 (1), P. 115-118 (2002)
https://doi.org/10.15407/spqeo5.01.115


Semiconductor Physics, Quantum Electronics & Optoelectronics. 2002. V. 5, N 1. P. 115-118.

PACS: 78.20.-e

Allowable deviation of LC layer thickness in cholesteric LCDs
A. Rybalochka1), V. Sorokin2), A. Sorokin3)

Institute of Semiconductor Physics, NAS of Ukraine, 45 pospect Nauky, 03028 Kyiv, Ukraine
Phone: +380 (44) 265 9786; fax: +380 (44) 265 5785:
1)e-mail: a_ryb@isp.kiev.ua ; 2)e-mail: vsorokin@isp.kiev.ua ; 3)e-mail: asorokin@isp.kiev.ua.

Abstract. The deviation of liquid crystal (LC) layer thickness in a display cell has considerable influence on the image quality at the addressing of cholesteric liquid crystal displays (ChLCD) by different kind of dynamic drive schemes. The driving principles that are realized in dynamic drive schemes by sequences of voltage pulses apply certain limitations on the value of this deviation. In this paper, we have compared allowable relative deviation of the LC layer thickness for two simple two-level dynamic drive schemes in ChLCD by the “dynamic hysteresis” method.

Keywords: cholesteric liquid crystal, cholesteric display, drive scheme.
Paper received 24.01.02; revised manuscript received 05.02.02; accepted for publication 12.02.02.

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