Semiconductor Physics, Quantum Electronics & Optoelectronics, 7 (1), P. 105-107 (2004)
https://doi.org/10.15407/spqeo7.01.105


PACS: 07.60.Rd

Metrological support of satellite-borne UV-spectrometry using a backscattering technique
V. Vashchenko*a, Zh. Patlashenkoa, E. Chernyshb

aKyiv National Taras Shevchenko University, 2, blok 1, acad. Glushkov ave., 03680 Kyiv, Ukraine
bUkrainian Antarctic Center,16 Blvd Taras Shevchenko, 01601, Kyev, Ukraine
*Correspondence: E-mail: daniilko@mail.ru; Telephone/fax: +380 (44) 2463880

Abstract. Methods and physicotechnical facilities for examination, calibration and metrological testing of the main power spectral characteristics (total spectral sensitivity, scattered stray radiation, dynamic range) of the vehicle-borne ozone UV spectrometers in the spectral range 250-350 nm are considered.
Keywords: spectrometer, space ozonometry, power spectral sensitivity, metrological workbench, standard UV source.
Paper received 19.11.03; accepted for publication 30.03.04.

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