Semiconductor Physics, Quantum Electronics & Optoelectronics. 2006. V. 9, N 1. P. 093-096.
Electric field and carrier concentration distributions
in the semiconductor under photorefractive Gunn effect
Yu. Fed’kovich Chernivtsi National University
2, Kotsyubynsky str., 58012 Chernivtsi, Ukraine; e-mail: semicon@chnu.cv.ua
Abstract. In the framework of the one-dimension field model of semiconductor
simultaneosly subjected to the action of carrier-warming electric field and two quasi-
monochromatic light waves the authors have numerically calculated the spatial-temporal
distributions of inner electric field Е(x,τ) and conductivity band electrons n(x,τ) in
dependence on external control parameters (intensity of the incident light waves, their
wave vector, external electric field and doping impurity concentration). It was found that
the device operating on the base of photorefractive Gunn effect may be controllably
switched between three following operation modes: low- and high-light wave intensity as
well as a transition mode. The influence of the external control parameters on the Е(x,τ)
distribution was determined for each mode in question. It was shown that one could
efficiently control the refractive index increment nΔ by means of proper change of the
control parameters.
Keywords: compensated semiconductor, drift instability, photorefractive Gunn effect,
refraction index.
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