Semiconductor Physics, Quantum Electronics and Optoelectronics, 10 (1) P. 045-048 (2007).
DOI:
https://doi.org/10.15407/spqeo10.01.045
References
1. Yu.M. Tairov, V.F. Tsvetkov, Technology of semiconductor and dielectric materials. Vysshaya shkola, Moscow, 1990 (in Russian). | | 2. N.V. Yurkovich, A.V. Lada, V.Yu. Loya, I.M. Migolinets, S.S. Krafchik, O.I. Pagulich, Peculiarities of obtaining inhomogeneous structures Ge2S3+Al (Bi, Pb, Te) with a preliminary set of component distribution // Collection of reports of the 14-th Intern. Symposium "Thin films in optics and electronics". - Kharkov, Published by Kharkov Physico-Technical Institute, 2002, p. 138-139 (in Russian). | | 3. Nanoscope. Command reference manual. - Digital Instruments, Santa Barbara, CA, 1999. | | 4. N.V. Yurkovich, Modelling and physical properties of modified structures based on vitreous germanium chalcogenides. Author's abstract of the candidate degree thesis (Phys.-math. sci.), Uzhgorod, 2004 (in Russian). | | 5. L.A. Zabashta, Investigations of optical properties of structures semiconductor - surface phase by using the method of multiangular ellipsometry. Author's abstract of the candidate degree thesis (Phys.-math. sci.), Sumy, 1996 (in Russian). | | 6. I.A. Shaikevich, P.I. Drozd, L.V. Poperenko, A small-size goniometer-ellipsometer and its application to studies of rough surface // Zavodskaya laboratoriya No 7, p. 35-36 (1985) (in Russian). | |
|
|