Abstract. The results of experimental researches dealing with formation of nanometric- size doped (Ag) layers on the surface (0001) between Te (1) –Te (1) telluride quintet layers in Bi 2 Te 3-х Se x 〈Ag〉 (х = 0.04) crystals under directed crystallization has been submitted. During the crystal growth as result of impurity diffusion along a surface (0001), accumulation, redistribution and nanocrystal formation between Te (1) –Te (1) layers occur. By the method of atomic-force microscopy, the Bi 2 Te 3-х Se x 〈Ag〉 crystal images with nanolayers were obtained. Being based on experimental data, the fractal dimension of nanocrystalline layers was estimated.

Keywords: nanomaterial, low-dimensional structure, atomic-force microscopy.

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