Semiconductor Physics, Quantum Electronics & Optoelectronics. 2010. V. 13, N 1. P. 036-042.


Ultrasonic assisted nanomanipulations with atomic force microscope
P.M. Lytvyn1, O.Ya. Olikh2, O.S. Lytvyn1, O.M. Dyachyns’ka1, I.V. Prokopenko1

1V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 41, prospect Nauky, 03028 Kyiv, Ukraine; e-mail: plyt@microscopy.org.ua
2Taras Shevchenko Kyiv National University, 64, Volodymyrs’ka, 01601 Kyiv, Ukraine

Abstract. Demonstrated experimentally in this work was the possibility of controlled handling the nanoparticles with the size from 50 up to 250 nm on a semiconductor surface by using an atomic force microscope under conditions of acoustic excitation. It has been shown that the selective transport of particles of a certain size is possible owing to the change of an ultrasonic vibration amplitude. Also in this study, possible mechanisms in which ultrasound may influence the particle-surface interaction and the probe-particle (surface) interaction have been analyzed.

Keywords: atomic force microscope, nanoparticle, nanomanipulations, ultrasound.

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