Semiconductor Physics, Quantum Electronics & Optoelectronics. 2012. V. 15, N 1. P. 061-064.
DOI: https://doi.org/10.15407/spqeo15.01.061

Effect of nanosize metal overlayer on C60 thin film optical parameters near fundamental absorption edge
N.L. Dmitruk1, O.Yu. Borkovskaya1, D.O. Naumenko1,2, T.S. Havrylenko1, E. Basiuk3, E.M. Shpilevsky4

1V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 41, prospect Nauky, 03028 Kyiv, Ukraine
2Research Center for Microsystems and Nanotechnology, Kaunas University of Technology, 51369 Kaunas, Lithuania
3Centro de Ciencias Aplicadas y Desarrollo Tecnológico, Universidad Nacional Autónoma de México, Mexico 4A.Luikov Heat and Mass Transfer Institute, National Academy of Sciences of Belarus, 220072, Minsk, Belarus

Abstract. The effect of nanosize metal overlayer, both evaporated on C60 films (Bi, In) and attached with nanoparticles of Ag or Au on the optical parameters of C60 films near the fundamental absorption edge has been studied. The values of direct band gap (Eg), the optical gap (Eo) in the framework of the Tauc model and Urbach tail parameter (EU) were determined from the absorption coefficient (a) spectra plotted in coordinates (αhν)2, (αhν)1/2, ln(α) vs hν, respectively. Parameters obtained testify diminishing the structural disorder in C60 thin films with nanosize metal overlayer at optimal ratio of C60 to metal layer thicknesses.

Keywords: C60 fullerene film, metal nanolayer, optical parameters, fundamental absorption edge.

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