Semiconductor Physics, Quantum Electronics & Optoelectronics. 2014. V. 17, N 1. P. 061-066.


Raman spectroscopy and X-ray diffraction studies of (GeS2 )100-x(SbSI)x glasses and composites on their basis
V.M. Rubish1 , V.O. Stefanovich2 , V.M. Maryan1 , O.A. Mykaylo2 , P.P. Shtets1 , D.I. Kaynts2 , I.M. Yurkin2

1Uzhgorod Scientific-Technological Center of the Institute for Information Recording, NAS of Ukraine, 4a, Zamkovi skhody str., 88000 Uzhgorod, Ukraine, e-mail:
2Uzhgorod National University, 3, Narodna sq., Uzhgorod 88000, Ukraine

Abstract. The structure and structural changes under the isothermal annealing of (GeS2)100-x (SbSI)x (0 ⟨ x ⟨ 90) glasses were investigated by Raman spectroscopy and X-ray diffraction methods. The nanoheterogeneous nature of these glasses structure has been revealed. The matrix of (GeS2)100-x (SbSI)x glasses is basically built just of binary GeS4 , SbS3 and SbI3 structural groups and contains a small amount of molecular fragments with homopolar Ge - Ge and S - S bonds. The phase structure arising in the glass matrix at crystallization corresponds to the structure of crystalline SbSI.

Keywords: chalcogenide glasses, Raman spectra, local structure, ferroelectric, nanocomposities.

Manuscript received 20.11.13; revised version received 30.01.14; accepted for publication 20.03.14; published online 31.03.14.

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