Semiconductor Physics, Quantum Electronics & Optoelectronics, 20 (1), P. 064-068 (2017).
DOI: https://doi.org/10.15407/spqeo20.01.064

Structural and optical studies of Cu6PSe5I-based thin film deposited by magnetron sputtering
I.P. Studenyak1, M.M. Kutsyk1, A.V. Bendak1, V.Yu. Izai1, V.V. Bilanchuk1, P. Kúš2, M. Mikula2

1Uzhhorod National University, Faculty of Physics, 3, Narodna Sq., 88000 Uzhhorod, Ukraine
1Comenius University, Faculty of Mathematics, Physics and Informatics, Mlynska dolina, 84248 Bratislava, Slovakia E-mail: studenyak@dr.com

Abstract. Cu5.5P1.2Se5.0I1.3 thin film was deposited onto silicate glass substrate by non-reactive radio frequency magnetron sputtering. Structural studies were carried out using X-ray diffraction and SEM techniques. Spectrometric studies of transmission spectra of Cu5.5P1.2Se5.0I1.3 thin film in the temperature interval 77 to 300 K were investigated. It is shown that the temperature behaviour of optical absorption edge is described by the Urbach rule. Temperature dependences of optical parameters of the Urbach absorption edge and refractive index have been analyzed. The influence of temperature and structural disordering on the Urbach tail has been studied. The comparison of optical parameters of Cu6PSe5I crystal and Cu5.5P1.2Se5.0I1.3 thin film has been performed.

Keywords: thin film, magnetron sputtering, optical absorption, Urbach rule, refractive index.

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