Semiconductor Physics, Quantum Electronics & Optoelectronics, 24 (1), P. 5-15 (2021).

New possibilities for phase-variation structural diagnostics of multiparametrical monocrystalline systems with defects
V.B. Molodkin1, V.Yu. Storizhko2, V.P. Kladko3, V.V. Lizunov1, A.I. Nizkova1, O.Yo. Gudymenko3, S.I. Olikhovskii1, M.G. Tolmachev1, S.V. Dmitriev1, I.I. Demchyk1*, E.I. Bogdanov1, B.I. Hinko1

1 G. Kurdyumov Institute for Metal Physics, NAS of Ukraine,
36, Academician Vernadsky Blvd., 03142 Kyiv, Ukraine
2 Institute of Applied Physics, NAS of Ukraine,
58, Petropavlivs’ka Ave., 40000 Sumy, Ukraine
3 V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine,
41, prosp. Nauky, 03680 Kyiv, Ukraine
* Correspondent author e-mail:

Abstract. Fundamental new features and physical nature of possibilities for purposeful influence of interrelated variations in different experimental conditions on changes of the selectivity of sensitivity of azimuthal dependence of the total integrated intensity dynamical diffraction to various types of defects in single crystals have been determined. As a result, the efficiency of the previously developed phase-variation principles of diagnostics has been improved. The proposed approach enabled us to demonstrate the presence of additional types of defects in the single crystals under study and to determine the defects parameters (sizes and concentrations). It makes it possible to obtain additional sensitivity and informativeness for phase-variation structure multiparametrical non-destructive diagnostics of monocrystalline systems with defects of various types.

Keywords: dynamical diffraction, X-ray irradiation, phase-variation diagnostics, azimuthal dependence, defects.

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