Semiconductor Physics, Quantum Electronics & Optoelectronics, 3 (2), P. 219-222 (2000)
https://doi.org/10.15407/spqeo3.02.219 PACS: 76.30.- v New possibility of retrospective EPR dosimetry I. Vorona, S. Ishchenko, S. Okulov, T.T. Petrenko Institute of Semiconductor Physics, pr. Nauky 45, Kyiv, 03028, Ukraine Semiconductor Physics, Quantum Electronics & Optoelectronics. 2000. V. 3, N 2. P. 219-222. Abstract. Tooth enamel plates irradiated by different types of radiation were studied by electron paramagnetic resonance imaging with local gradient of magnetic field. The dependence of radiation defect distributions on an irradiation type was found. A new procedure of retrospective electron paramagnetic resonancedosimetry determining the irradiation type was proposed. Keywords: dosimetry, electron paramagnetic resonance, electron paramagnetic resonance imaging, tooth enamel Paper received 18.09.99; revised manuscript received 07.12.99; accepted for publication 21.03.00. [Contents] This work is licensed under a Creative Commons Attribution-NoDerivatives 4.0 International License. |