Semiconductor Physics, Quantum Electronics & Optoelectronics, 3 (2), P. 219-222 (2000)
https://doi.org/10.15407/spqeo3.02.219

PACS: 76.30.- v

New possibility of retrospective EPR dosimetry

I. Vorona, S. Ishchenko, S. Okulov, T.T. Petrenko

Institute of Semiconductor Physics, pr. Nauky 45, Kyiv, 03028, Ukraine

Semiconductor Physics, Quantum Electronics & Optoelectronics. 2000. V. 3, N 2. P. 219-222.

Abstract. Tooth enamel plates irradiated by different types of radiation were studied by electron paramagnetic resonance imaging with local gradient of magnetic field. The dependence of radiation defect distributions on an irradiation type was found. A new procedure of retrospective electron paramagnetic resonancedosimetry determining the irradiation type was proposed.

Keywords: dosimetry, electron paramagnetic resonance, electron paramagnetic resonance imaging, tooth enamel

Paper received 18.09.99; revised manuscript received 07.12.99; accepted for publication 21.03.00.

[Contents]
Full text in PDF (Portable Document Format) are available for free. [PDF 118K]

Back to Volume 3 N2

Creative Commons License
This work is licensed under a Creative Commons Attribution-NoDerivatives 4.0 International License.