https://doi.org/10.15407/spqeo4.02.134
Semiconductor Physics, Quantum Electronics & Optoelectronics. 2001. V. 4, N 2. P. 134-138.
PACS: 42.25.B, 77.84.B, 78.20.C
Spectral properties of reflective interference filters
V.Yu. Pervak, L.V. Poperenko
Taras Shevchenko Kiev University,
prosp. Acad.Glushkova 6, Kiev, Ukraine, 01028.
Yu.A. Pervak
Institute of Semiconductor Physics, National Academy of Sciences of Ukraine,
prosp. N auki 45, Kiev, Ukraine, 03650. Phone (38044) 265 1817, Fax (38044) 265 8342.
E-mail: Pervak@dep48.semicond.kiev.ua
Abstract. The spectral properties of band reflective interference filters are investigated. The operation of the filter is based on the method of residual rays. Angular dependences of the filter transmission bandshape on the parameters of multilayer coating, such as the thickness, refractive indexes, the number of the layers, are analyzed.
Keywords: interference filters, suppression of background transmission.
Paper received 02.11.00; revised manuscript received 23.01.01; accepted for publication 16.02.01.
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