References

Semiconductor Physics, Quantum Electronics and Optoelectronics, 5 (2) P. 170-175 (2002).

References

1. Miwa Tsuji, Tetsuya Aramoto, Hideaki Ohyama, et al., Characterization of CdS thin film in hight efficient CdS/CdTe solar cells // J. Cryst. Growth, 214/215 p.1142-1147 (2000). https://doi.org/10.1016/S0022-0248(00)00291-8

2. K. Durose, P.R. Edwards, D.P. Halliday, Materials aspects of CdTe/CdS solar cells // J. Cryst. Growth, 197pp.733-742(1999). https://doi.org/10.1016/S0022-0248(98)00962-2

3. D. Bonnet, H. Rabenhorst, in: 9th IEEE Photovoltaic Specialists Conf., IEEE, Silver Springs, MD, p.219 (1972).

4. P.J. Sebastian, Hailin Hu // Adv. Mater. Opt. Electron, 4 p.407 (1994). https://doi.org/10.1002/amo.860040604

5. M. Ocampo, P.J. Sebastian, J. Campos // Phys. Status Solidi, 143p. K24 (1994). https://doi.org/10.1002/pssa.2211430130

6. Ch. Bouchenaki, B. Ullrich. J.P. Zielinger, H. Nguyen Cong, P. Chartier // J. Cryst. Growth, 101p.797(1990). https://doi.org/10.1016/0022-0248(90)91083-3

7. C. Sravani, K.T.R. Reddy, P.J. Reddy. Physical behavior of CdO films prepared by activated reactive evaporation // Semicond. Sci. Technol, 6 p. 1036 (1992). https://doi.org/10.1088/0268-1242/6/10/016

8. H. Nguyen Cong, P. Chartier // Sol. Energy Matter. Sol.Cells, 30p. 127 (1993). https://doi.org/10.1016/0927-0248(93)90014-T

9. K. Gurumurugan, D. Mangalraj, Sa. K. Narayandass, C.Balasubramanian // Phys. Status Solidi (a), 143p. 85(1994). https://doi.org/10.1002/pssa.2211430111

10. S.K. Das // Sol. Energy Mater. Sol. Cells, 29p. 277 (1993).

11. T. Edamura, J. Muto ìElecrodepos ition and properties of copperdoped cadmium sulphideî// Thin Solid Films, 235p.198 (1993). https://doi.org/10.1016/0040-6090(93)90265-Q

12. P.J. Sebastian, M.E. Calixto, Porous CdS:CdO composite structure formed by screen printing and sintering of CdS in air // Thin Solid Films, 360 pp.128-132 (2000). https://doi.org/10.1016/S0040-6090(99)01088-3

13. S. Sirohi, V. Kumar, T.P. Sharma, Optical, structural and electrical properties of CdTe sintered films // Optical Materials, 12pp.121-125 (1999). https://doi.org/10.1016/S0925-3467(98)00053-6

14. S. A. Al Kuhaimi, Influence of preparation technique on the structural, optical and electrical properties of polycrystalline CdS films // Vacuum, 51, No 3 pp. 349-355 (1998). https://doi.org/10.1016/S0042-207X(98)00112-2

15. S.S.Gorelik and M.Ya.Dashewcky. Material science of semiconductors and dielectrics // Moskow, Metallurgy , 576 p.(in Russian) (1988).

16. L.J. Van der Pauw. A method of measuring specific resistivity and Hall effect of discs of arbitrary shape // Philips Res.Repts. 13, No 1, pp.1-9 (1958).

17. Balzar D. Voigt-function model in diffraction line-broadening analysis / Microstructure Analysis from Diffraction, edited by R. L. Snyder, H. J. Bunge, J. Fiala. - International Union of Crystallography. - 157 p (1999).

18. S.S. Gorelik. Recrystallization of metalls and allois // Moskow, Metallurgy , 568 p. (in Russian) (1978).

19. I.A.Birger, Residual stress // Ãoscow, State scientific and technical publishing house of the machine-building literature, p.326 (in Russian) (1963).