Semiconductor Physics, Quantum Electronics & Optoelectronics, 6 (2), P. 172-182 (2003)
https://doi.org/10.15407/spqeo6.02.172 Semiconductor Physics, Quantum Electronics & Optoelectronics. 2003. V. 6, N 2. P. 172-182. PACS : 73.20.Dx, 78.66.-w Characteristics of confined
exciton states in silicon quantum wires
Institute of Semiconductor Physics, NASciences
of Ukraine, 45 prospect Nauky, 03028 Kiev, Ukraine Abstract. We have studied theoretically the combined effect of quantum confinement
and "dielectric enhancement" on the characteristics of the exciton
ground state in quasi-1D silicon nanowires. Consideration has been made
within effective mass and classical image force approximations. As a result,
exciton binding energy, total energy of the exciton transition, radiative
recombination time, intensity and internal quantum efficiency of the exciton
photoluminescence (PL) in quantum wires (QW) have been obtained as functions
of wire thickness, dielectric constants of adjacent materials, conduction
and valence band-offsets. It was shown that even at room temperatures
and moderate intensities of laser excitation the quantum efficiency of
the exciton PL can achieve very high values (tens of %) in the case of
extremely thin QWs (with thickness 1 - 3 nm). Moreover, according to theory,
the exciton recombination time and the quantum efficiency have to be oscillating
functions of QW thickness in thickness range 1 - 5 nm due to the indirect
band-gap nature of silicon material. Keywords:
exciton, quantum confinement, binding energy, silicon nanotubes, photoluminescence,
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