2. G. Entine, P. Waer, T. Tiernan, M.R. Squillante. Survey of CdTe nuclear detector applications // Nucl. Instr. and Meth.A283, pp. 282-290 (1989). https://doi.org/10.1016/0168-9002(89)91373-9
5. Y. Eisen, A Shor. CdTe and CdZnTe materials for room-temperature X-ray and gamma ray detectors // J. Crystal Growth. 184/185, pp. 1302-1312 (1998). https://doi.org/10.1016/S0022-0248(98)80270-4
6. R.H. Redus, A.C. Huber, J.A. Pantazis. Improved thermo-electrically cooled X/g-ray detectors and electronics // Nucl.Instr. and Meth.A458, pp. 214-219 (2001). https://doi.org/10.1016/S0168-9002(00)00864-0
7. M. Fiederle, D. Ebling, C. Eiche, P. Hug, W. Joerger, M.Laasch, R. Schwarz, M. Salk, K.W. Benz. J. Crystal Growth. 146, pp. 142-147 (1995). https://doi.org/10.1016/0022-0248(94)00473-0
8. T. Toshifumi, S. Adachi, H. Nakanishi, K. Ohtsuka. Optical constants of Zn1-xCdxTe Ternary alloys : Experiment and modeling // Jpn. Appl. Phys.32, pp. 3496-3501 (1993). https://doi.org/10.1143/JJAP.32.3496
9. G.L. Hansen, J.L. Schmit, T.N. Casselman. Energy gap versus alloy composition and temperature in Hg1-xCdxTe // J.Appl. Phys. 53, 7099-7101 (1982). https://doi.org/10.1063/1.330018
10. S.S. Devlin. Transport properties. In: Physics and Chemistry of II-VI Compounds. Eds. M. Aven, and J.S. Prener. North-Holland Publishing Gompany, New York, 1967. p.418.
11. I. Turkevych, R. Grill, J. Franc, E. Belas, P. Hoschl and P.Moravec. High-temperature electron and hole mobility in CdTe // Semicond. Sc. Techn. 17, 1064 (2002). https://doi.org/10.1088/0268-1242/17/10/305
13. A. Castaldini, A. Cavallini, B. Fraboni. Deep energy levels in CdTe and CdZnTe // J. Appl. Phys. 83, 2121-2126 (1998). https://doi.org/10.1063/1.366946
14. J.S. Blakemore. Semiconductor physics. Pergamon Press,Oxford. pp. 139-140 (1962).
16. S.M. Sze. Physics of semiconductor devices. Wiley, New York.pp. 800-803 (1973).
17. A.I. Vlasenko, Z.K. Vlasenko, A.V. Ljubchenko. Photoconductivity spectral characteristics of semiconductors with an axponential edge of the fundamental absorption // Semiconductors. 33, 1295-1299 (1999). https://doi.org/10.1134/1.1187842