References

Semiconductor Physics, Quantum Electronics and Optoelectronics, 6 (2) P. 233-237 (2003).

References

1. Conference on Electronics for Extreme Environments, 1999NASA/JPL, Pasadena Convention Center, Pasadena, 1999, http://extelect.jpl.nasa.gov/conference/.

2. L.G. Rubin, Cryogenic thermometry: a review of progress since 1982 // Cryogenics 37, pp. 341-356 (1997). https://doi.org/10.1016/S0011-2275(97)00009-X

3. J.M. Swarts, Temperature measurement and control, Lake Shore Product Catalog available from Lake Shore Cryotronics, Inc., Westerville, OH, 43082, USA, (1999).

4. S.M. Sze, Physics of Semiconductor Devises, 2nd ed., Wiley, New York, (1981).

5. I.V. Vikulin, V.I. Stafeev, Fizika poluprovodnikovyh priborov, 2nd ed., Radio i svyaz', Moscow, (1990).

6. D.J.Roulston, N.D. Arora, S.G. Chamberlain, Modelling and measurement of minority-carrier lifetime versus doping in diffused layers of n+-p silicon diodes // IEEE Trans. Electron Devices ED-29, pp.284-291 (1982). https://doi.org/10.1109/T-ED.1982.20697