Semiconductor Physics, Quantum Electronics and Optoelectronics, 12 (2) P. 162-164 (2009).
DOI: https://doi.org/10.15407/spqeo12.02.162


References

1. M. Born, E. Volf, Fundamental Optics. Nauka, Moscow, 1970 (in Russian).
2. D.E. Aspens and J.B. Theeten, Spectroscopic analysis of the interface between Si and its thermally grown oxide // J. Electrochem. 127(6), p. 1359-1365 (1980).
https://doi.org/10.1149/1.2129899
3. A. Telen, Designing the multilayer interference light filters // Physics of thin films 5, p. 46-83, Mir, Moscow (1972) (in Russian).
4. V.M. Prokopets, I.A. Shaykevich, L.J. Robur, Optical properties of silicon-nitride-based ceramics with molybdenum and aluminum impurities // Ukr. Fizychny Zhurnal 50(1), p. 58-62 (2005) (in Ukrainian).
5. E.M. Voronkova, B.I. Grechushnikov, G.I. Distler and I.P. Petrov // Optical Materials for Infra-red Technics. Nauka, Moscow, 1965 (in Russian).