Semiconductor Physics, Quantum Electronics & Optoelectronics. 2011. V. 14, N 2. P. 170-174.
DOI: https://doi.org/10.15407/spqeo14.02.170


Charge transport in bismuth orthogermanate crystals
T.M. Bochkova, S.N. Plyaka

Dnepropetrovsk National University, 49050, Dnepropetrovsk, Ukraine Phone:+38 (056) 776-83-18; e-mail: tbochkova@meta.ua

Abstract. Current-voltage relations in bismuth orthogermanate crystals with Ag, Pt, In- Ga electrodes have been measured in the modes of double and unipolar injection of charge carriers. It has been shown that Bi 4 Ge 3 O 12 is relaxation type semiconductor. The appearance of the regions with negative differential resistance or sublinear rise of the current in characteristics is connected with the injection of the minority charge carriers and recombination processes in the space charge layer.

Keywords: bismuth orthogermanate, current-voltage characteristics, relaxation type semiconductors.

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