Semiconductor Physics, Quantum Electronics & Optoelectronics. 2011. V. 14, N 2. P. 200-202.
https://doi.org/10.15407/spqeo14.02.200



References 

1.  V.A. Kutasov, L.N. Lukyanova, P.P. Konstantinov, High-effective  thermoelectric  materials  n-(Bi,Sb) 2 Te 3   for  the  temperature  below  200 K. Fizika  i  tekhnika  poluprovodnikov  34(4),  p. 389-393 (2000), in Russian.
2.  B.D. Luft,  V.A. Perevoshchikov,  L.N. Vozmilova et al.,  Physical-chemical  Methods  of  the Semiconductor Surfaces Treatment. Radio i Svyaz’, Moscow, 1982 (in Russian).
3.  V.A. Perevoshchikov,  Processes  of  the  chemical-dynamic polishing of the semiconductor surfaces. Vysokochistyye  veshchestva,  2,  p. 5-29  (1995),  in Russian.
4.  L.C. Lovell, J.H. Wernick, Dislocation etch pits in bismuth. J. Appl. Phys., 30(2), p. 234-236 (1958). 5.  I. Toramoto, S. Takayangi, Dislocation etch pits on bismuth  telluride  crystals .  J.  Appl.  Phys.  32(1), p. 119-120 (1961).
6.  H.T. William, Handbook of Metal Etchants. 1991, p. 763  (Y. Sato  et al. .  Jpn.  J.  Appl.  Phys.,  2, p. 688 (1963)).
7.  V.A. Perevoshchikov, V.D. Skupov, Peculiarities of Abrasive  and  Chemical  Treatment  of  the  Semiconductor Surfaces. N.Novgorod, 1992 (in Russian).
8.  K. Sangval,  Etching  of  Crystals:  Theory, Experiment,  Application.  Mir,  Ìoscow,  1990  (in Russian).