Semiconductor Physics, Quantum Electronics & Optoelectronics. 2015. V. 18, N 2. P. 188-192.
https://doi.org/10.15407/spqeo18.02.188

Temperature studies of optical parameters in (Ag3AsS3)0.6(As2S3)0.4 thin films
I.P. Studenyak1, M.M. Kutsyk1, Y.Y. Rati1, V.Yu. Izai1, S. Kökényesi2, L. Daróci2, R. Bohdan2

1Uzhhorod National University, Faculty of Physics, 3, Narodna Sq., 88000 Uzhhorod, Ukraine
2Department of Experimental Physics, Faculty of Science and Technology, University of Debrecen, 18/a Bem Sq., 4026 Debrecen, Hungary, E-mail: studenyak@dr.com

Abstract. (Ag3AsS3)0.6(As2S3)0.4 thin films were deposited onto a silica substrate by using rapid thermal evaporation. The surfaces of the films were covered with Ag-rich crystalline micrometer-sized cones. The optical transmission spectra of thin films were studied within the temperature range 77…300 K. The absorption spectra in the region of its exponential behaviour were analysed, the dispersion dependences of refractive index as well as the temperature dependences of energy position of absorption edge and Urbach energy were investigated.

Keywords: thin film, thermal evaporation, optical absorption, Urbach energy, refractive index.

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