Semiconductor Physics, Quantum Electronics & Optoelectronics. 2016. V. 19, N 2. P. 169-172.
DOI: https://doi.org/10.15407/spqeo19.02.169

New method for estimating the refractive index of optical materials in spectrally selective elements
A.A. Manko1, G.S. Svechnikov2

1Odessa National Communication Academy, 1, Kovalska str., 65029 Odessa, Ukraine
2V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 41, prospect Nauky, 03028 Kyiv, Ukraine

Abstract. A numerical simulation of the scattering indicatrix in optical spectral-selective cylindrical form elements has been performed. As it follows from the results of the calculations, the shape of the scattering indicatrix of these elements is unambiguously determined by the refractive index of material from which they are made. Location of angular peaks in the indicatrix in combination with its shape allows to estimate the refractive index with sufficiently high degree of accuracy.

Keywords: optical cylindrical element, light scattering, Monte Carlo method, indicatrix of scattering, refractive index.

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