Semiconductor Physics, Quantum Electronics & Optoelectronics, 28 (2), P. 215–220 (2025). Ellipsometric study of Ag6+x(P1-xSix)S5I single crystals A.I. Pogodin1, M.M. Pop1,2*, I.O. Shender1, M.J. Filep3, T.O. Malakhovska1, O.P. Kokhan1, K.V. Skubenych1, V. Izai4
1Uzhhorod National University, 46, Pidhirna str., 88000 Uzhhorod, Ukraine Abstract. Single crystals of Ag6+x(P1-xSix)S5I (x = 0, 0.25, 0.5, 0.75, 1) solid solutions were grown by directional crystallization from the melt. Grown crystals were investigated using XRD and spectral ellipsometry. Ag6+x(P1-xSix)S5I crystals are characterized by formation of a continuous series of solid solutions with a cubic F-43m structure. The studied samples had a nonlinear spectral dependence of the refractive index n and the extinction coefficient k. The presence of a sharp maximum of n and a rather sharp decrease in the k spectral dependences are observed within the 570...730 nm range. The spectral dependence of the refractive index was described by the single-oscillator Wemple-DiDomenico (WD) model. Parameters of the Wemple-DiDomenico model for Ag6+x(P1-xSix)S5I single crystals were determined. The effect of heterovalent cationic Р+5 → Sі+4 substitution on parameters of the Wemple–DiDomenico model was discussed. Keywords: argyrodite, single crystal, refractive index, band gap.
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