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Semiconductor Physics, Quantum Electronics & Optoelectronics, 29 (2), P. 191–202 (2026).
Temperature-dependent charge accumulation and current-voltage characteristics of Ag7–x(PxGe1–x)S5I superionic heterostructures for solid-state energy devices
1Uzhhorod National University, 46 Pidhirna Street, 88000 Uzhhorod, Ukraine Abstract.
The work investigates temperature-dependent charge accumulation and relaxation processes, as well as the current-voltage characteristics of Ag|Ag7–x(PxGe1–x)S5I|Se heterostructures with different Ge/P ratios. The current-time dependences I(t) were studied in a potentiostatic mode (0.4 V, 600 s) followed by discharge (0 V, 600 s) at 20 °C and 60 °C. It is shown that the relaxation is described by a bi-exponential model with time constants τ1 and τ2, corresponding to fast interfacial and slow diffusion processes, respectively. It was established that with increasing temperature, the relaxation times decrease due to the activation of Ag+ ion transport and the softening of selenium. Arrhenius analysis revealed different activation energies for the fast (~ 0.1…0.3 eV) and slow (~ 0.05…0.15 eV) processes. The current-voltage characteristics exhibit nonlinear and asymmetric behavior with current maxima associated with interfacial polarization and the formation of Ag2Se. The minimum relaxation times are observed for the composition Ag6.5P0.5Ge0.5S5I.
Keywords: superionic conductors, argyrodite structure, Ag7–x(PxGe1–x)S5I, solid electrolyte heterostructures, charge-discharge processes, interfacial polarization, solid-state electrochemical devices. ![]() This work is licensed under a Creative Commons Attribution-NoDerivatives 4.0 International License.
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