https://doi.org/10.15407/spqeo3.03.371
Semiconductor Physics, Quantum Electronics & Optoelectronics. 2000. V. 3, N 3. P. 371-378.
PACS: 42.79.Fm,W
Properties and application of the unequal thickness two-component interference systems
I.V. Fekeshgazi, V.Yu. Pervak, Yu.A. Pervak
Institute of Semiconductor Physics of Ukrainian National Academy of Sciences,
prosp. Nauki 45, Kiev, Ukraine, 01650. Phone 380 44 265 1817, Fax 380 44 265 8342.
E-mail: Pervak@dep48.semicond.kiev.ua
Abstract. The methods of synthesis and designing of the two-component unequal thickness multilayer interference systems as well as interconnection of their indices of layers are presented. A solution of the problem of suppressing high reflection zones at any harmonic frequency while maintaining high reflection at the operating frequency is proposed. The evolution of refractive zones at the inclined light incidence on the multilayer systems are studied. The results of the synthesis of antireflective coatings for some widely separated wavelengths are discussed. The application of results for the specific spectral characteristics and interference filters are proposed.
Keywords: multilayer interference coatings, multilayer mirror, prism interference polarization splitter.
Paper received 19.04.00; revised manuscript received 23.05.00; accepted for publication 30.06.00.
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