Semiconductor Physics, Quantum Electronics & Optoelectronics, 6 (3), P. 354-356 (2003)
https://doi.org/10.15407/spqeo6.03.354


Semiconductor Physics, Quantum Electronics & Optoelectronics. 2003. V. 6, N 3. P. 354-356.

PACS: 42.79.Wc

Optical characteristics of Al2O3 oxide coatings on copper mirrors made by diamond microgrinding
V.A. Odarich, L.V. Poperenko, V.S. Staschuk, Y.V. Filipov

National Taras Shevchenko University of Kyiv, 6 Glushkova Prosp., 03127 Kyiv, Ukraine
e-mail: fyv@ukr.net

Abstract. Ellipsomety examination of dielectric sheetings and measured of reflection spectrum at normal incidence there carried out. A film of Al2O3 on a surface of copper mirrors of a diamond microgrinding was deposited. The thickness and index of refraction of coatings are determined.
Keywords: reflectivity, parameters of ellipsomerty, index of refraction, copper mirrors, aluminium oxide, diamond microgrinding.
Paper received 28.12.02; revised manuscript received 10.06.03; accepted for publication 17.06.03.

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