https://doi.org/10.15407/spqeo6.03.417
Semiconductor Physics, Quantum Electronics & Optoelectronics. 2003. V. 6, N 3. P. 417-422.
PACS: 42.15.F, 42.25.F
Singular optics methods
for analysis of spatial structure of diffraction field of optical elements
O.P. Budnyk, R.A. Lymarenko
International Centre "Institute of
Applied Optics", NAS of Ukraine, 10-G Kudryavska str., 04053 Kyiv,
Ukraine
Phone: +38(044) 212 2158, fax: +38(044) 212 4812, e-mail: myoptics@zeos.net
Abstract. The
paper is devoted to developing methods of analytical and experimental
investigations of diffraction and interference phenomena used in test
systems for optical elements. The theoretical analysis and experimental
results illustrate the possibility of describing diffraction phenomena
using the objects and methods that were developed in singular optics.
It was shown that a system of dislocations in singular component of diffraction
field represents its topology. The diffracted field has a system of hidden
optical vortices that are smoothly transformed during deformation of an
aperture depending on boundary flexion. The proposed experimental proof
ground can be useful for the analysis of a wavefront structure. It is
also considered the technique for more accurate evaluation of Ronchi test
results. The mathematical background of the Ronchi test technique is developed.
It describes sufficiently well the wavefront shape, grating plate parameters,
image sensor characteristics, parameters of image acquisition and restoration.
The fringe pattern distributions and their spatial spectrum are calculated.
Both the results of computer simulation of Ronchi fringe pattern and experimental
ones obtained using image sensor and the applied image enhancement algorithms
are shown.
Keywords:
singular optics, wavefront shape, Ronchi test.
Paper received 09.12.02; revised manuscript
received 12.06.03; accepted for publication 17.06.03.
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