https://doi.org/10.15407/spqeo7.03.297
PACS: 68.55.Jk, 29.40.Mc
Structural dependence of CsI(Tl) film scintillation properties
A. Ananenko, A. Fedorov, A. Lebedinsky, P. Mateychenko, V. Tarasov, Yu. Vidaj
Institute for Scintillation Materials, NAS of Ukraine, 60, Lenin str., 61001 Kharkov, Ukraine
Phone: +380 (572) 30 79 58 ; fax: +380 (572) 32 10 82; E-mail: fedorov@xray.isc.kharkov.com
Abstract. Scintillating CsI(Tl) films were obtained by vacuum deposition on single crystalline LiF substrates and non-orienting glass substrates. Their structure and morphology were examined by X-ray diffraction and scanning electron microscopy. Scintillation properties of films dependent on their structure are discussed.
Keywords: scintillator, vacuum deposition, structure, pulse height spectra.
Paper received 07.06.04; accepted for publication 21.10.04.
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